Wyniki wyszukiwania
IEEE Journal of Solid-State Circuits > 2010 > 45 > 9 > 1856 - 1869
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 130 - 141
Electronics Letters > 2010 > 46 > 7 > 518 - 520
Solid State Electronics > 2009 > 53 > 12 > 1313-1317
IEEE Transactions on Semiconductor Manufacturing > 2008 > 21 > 1 > 104 - 109
IEEE Transactions on Electron Devices > 2008 > 55 > 7 > 1682 - 1692
2007 Internatonal Conference on Microelectronics > 429 - 432
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 112 - 118
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 2204 - 2209
IEEE Transactions on Nuclear Science > 2007 > 54 > 4-2 > 971 - 974
Thin Solid Films > 2006 > 504 > 1-2 > 126-128
Thin Solid Films > 2006 > 504 > 1-2 > 11-14
IEEE Transactions on Electron Devices > 2006 > 53 > 8 > 1815 - 1820
Current Applied Physics > 2003 > 3 > 1 > 45-49